Long-Term Follow-up of Transcatheter Ventricular Septal Defect Closure in Children, and Comparison of Single-Hole Versus Multi-holes Ventricular Septal Defects
| Author | Hojjat Mortezaeian | en |
| Author | Mina Farshidgohar | en |
| Author | Ahmad Vesal | en |
| Author | Behzad Alizadeh | en |
| Author | Yasaman Khalili | en |
| Author | Mahmood Meraji | en |
| Author | Nikolaus Haas | en |
| Orcid | Hojjat Mortezaeian [0000-0001-6248-8185] | en |
| Orcid | Yasaman Khalili [0000-0002-2269-1207] | en |
| Issued Date | 2022-12-31 | en |
| Abstract | Background: Evaluation of complications after transcatheter ventricular septal defect (VSD) closure in long-term follow-up and large samples of children is limited. Objectives: We compared the residual shunt after transcatheter closure in VSDs with a single hole and multiple holes, a new task that has not been done so far. Methods: This retrospective study included all patients who underwent transcatheter device closure for VSD in a tertiary cardiovascular center from 2009 to 2020. Follow-up evaluation using transthoracic echocardiography (TTE) and electrocardiogram (ECG) was performed at 1, 6, 12 months, and annually after the procedure. Results: A total of 409 patients underwent transcatheter VSD closure. The mean age was 7 years (2 - 15 years), and the median follow-up duration was 48 months (1 - 10 years). The number of patients with a singular VSD was 259 (63.4%), and those with multiple exit holes were 150 (36.6%). The incidence of a residual shunt immediately after implantation was significantly higher in VSDs with multiple holes than those with a single hole (P = 0.008). During the follow-up, the residual shunts decreased in the group of VSDs with a single hole. Forty-five patients (11%) and 16 patients (4%) had a new-onset of mild and moderate tricuspid regurgitation (TR), respectively, and it decreased dramatically over time. Only 1 patient showed a new-onset mild aortic regurgitation (AR). The most crucial complication shown in 2 patients was a persistent complete heart block. Conclusions: Ventricular septal defects with multiple exit holes are a risk factor for a residual shunt. After transcatheter VSD closure, the residual shunt in patients with a multiple-hole VSD was significantly higher (P = 0.008). Although TR may increase during the procedure, it decreases dramatically over time. Interestingly, patients who had pre-procedure tricuspid or aortic regurgitation disappeared after 2 years of the procedure. The most important complication was a complete heart block in 2 patients. | en |
| DOI | https://doi.org/10.5812/ijp-129278 | en |
| Keyword | Ventricular Septal Defect | en |
| Keyword | Transcatheter Closure | en |
| Keyword | Tricuspid Regurgitation (TR) | en |
| Keyword | Aortic Regurgitation (AR) Residual Shunt | en |
| Keyword | Mono-hole VSDs | en |
| Keyword | Multiple-Hole VSDs | en |
| Keyword | Follow-up | en |
| Publisher | Brieflands | en |
| Title | Long-Term Follow-up of Transcatheter Ventricular Septal Defect Closure in Children, and Comparison of Single-Hole Versus Multi-holes Ventricular Septal Defects | en |
| Type | Research Article | en |